专利名称：Method and apparatus for testing a circuit发明人：Hiroshi Yoshihara申请号：US11758743申请日：20070606公开号：US07954020B2公开日：20110531
专利附图：
摘要：A system and method for testing a memory array are disclosed which mayinclude establishing a stored data vector, including a plurality of data bits, within at leastone circuit; applying one or more logical operations on the stored data vector togenerate a succession of original data vectors at the at least one circuit; transmitting the
succession of original data vectors through a memory array to provide a succession ofexercised data vectors; comparing the succession of exercised data vectors to thesuccession of respective original data vectors; and determining whether the memoryarray passes or fails based on the comparing step.
申请人：Hiroshi Yoshihara
地址：Round Rock TX US
国籍：US
代理机构：Gibson & Dernier LLP
代理人：Matthew B. Dernier
更多信息请下载全文后查看
因篇幅问题不能全部显示，请点此查看更多更全内容